Digital Twins in Industry 4.0 Cyber Security
Lo, Carol, Win, Thu Yein, Rezaeifar, Zeinab, Khan, Zaheer and Legg, Phil
(2024)
Digital Twins in Industry 4.0 Cyber Security.
In:
2023 IEEE Smart World Congress (SWC).
IEEE, pp. 1-4.
ISBN 979-8-3503-1980-4
Abstract
The increased adoption of sophisticated Cyber Physical Systems (CPS) in critical infrastructure and various aspects of Industry 4.0 has exposed vulnerabilities stemming from legacy CPS and Industrial Internet of Things (IIoT) devices. The interconnectedness nature of these systems have been severely affected in the event of a successful attack by Advanced Persistent Threats (APT), as evidenced by the Colonial Pipeline and the Stuxnet attacks. This paper explores the application of Digital Twins for cyber security, a promising technology that addresses the multifaceted issues in Industry 4.0. Therefore, this paper first presents a summary of the state-of-the-art on several related topics, including CPS security, APT and mitigation, and Digital Twins for cyber security. Then, it discusses how Digital Twins have been used to address the current research limitations on APT detection, including attack detection, attack coverage, dataset collection and usage. Finally, a brief discussion of the future research directions will be provided.
Full text not available from this repository.
More Information
| Additional Information: 2023 IEEE Smart World Congress (SWC)
Date of Conference: 28-31 August 2023
DOI: 10.1109/SWC57546.2023.10449147
Publisher: IEEE
Conference Location: Portsmouth, United Kingdom |
| Related URLs: |
| Depositing User:
Thomas Thu Yein
|
Identifiers
Users with ORCIDS
Catalogue record
| Date Deposited: 16 Apr 2026 09:16 |
| Last Modified: 16 Apr 2026 09:16 |