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Lo, Carol, Win, Thu Yein, Rezaeifar, Zeinab, Khan, Zaheer and Legg, Phil (2024) Digital Twins in Industry 4.0 Cyber Security. In: 2023 IEEE Smart World Congress (SWC). IEEE, pp. 1-4. ISBN 979-8-3503-1980-4

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Abstract

Abstract

The increased adoption of sophisticated Cyber Physical Systems (CPS) in critical infrastructure and various aspects of Industry 4.0 has exposed vulnerabilities stemming from legacy CPS and Industrial Internet of Things (IIoT) devices. The interconnectedness nature of these systems have been severely affected in the event of a successful attack by Advanced Persistent Threats (APT), as evidenced by the Colonial Pipeline and the Stuxnet attacks. This paper explores the application of Digital Twins for cyber security, a promising technology that addresses the multifaceted issues in Industry 4.0. Therefore, this paper first presents a summary of the state-of-the-art on several related topics, including CPS security, APT and mitigation, and Digital Twins for cyber security. Then, it discusses how Digital Twins have been used to address the current research limitations on APT detection, including attack detection, attack coverage, dataset collection and usage. Finally, a brief discussion of the future research directions will be provided.

Item Type: Book Section
Additional Information: 2023 IEEE Smart World Congress (SWC) Date of Conference: 28-31 August 2023 DOI: 10.1109/SWC57546.2023.10449147 Publisher: IEEE Conference Location: Portsmouth, United Kingdom
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Depositing User: Thomas Thu Yein
URI: https://sure.sunderland.ac.uk/id/eprint/19850

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Additional Information
2023 IEEE Smart World Congress (SWC) Date of Conference: 28-31 August 2023 DOI: 10.1109/SWC57546.2023.10449147 Publisher: IEEE Conference Location: Portsmouth, United Kingdom
Depositing User

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Item ID
19850
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ISBN
979-8-3503-1980-4

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ORCID for Thu Yein Win

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Date Deposited
16 Apr 2026 09:16
Last Modified
16 Apr 2026 09:16

Contributors

Author
Carol Lo
Author
Zeinab Rezaeifar
Author
Zaheer Khan
Author
Phil Legg

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