Karagiannidis, Panagiotis, Hastas, N. A., Koutsogeorgis, D. C., Tsakonas, C., Logothetidis, S., Cranton, W. M. and Dimitriadis, C. A. (2010) Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM). In: 3rd International Symposium on Transparent Conductive Materials, TCM 2010, 17-21 Oct 2010, Crete, Greece.
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| Item Type: | Conference or Workshop Item (Poster) |
|---|---|
| Depositing User: | Panagiotis Karagiannidis |
| URI: | https://sure.sunderland.ac.uk/id/eprint/7899 |
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Depositing User
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Item ID
7899
Users with ORCIDS
ORCID for Panagiotis
Karagiannidis
Catalogue record
Date Deposited
02 Oct 2017 13:19
Last Modified
04 Jun 2025 15:28
Contributors
Author
Author
N. A. Hastas
Author
D. C. Koutsogeorgis
Author
C. Tsakonas
Author
S. Logothetidis
Author
W. M. Cranton
Author
C. A. Dimitriadis
