Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM)

Karagiannidis, Panagiotis, Hastas, N. A., Koutsogeorgis, D. C., Tsakonas, C., Logothetidis, S., Cranton, W. M. and Dimitriadis, C. A. (2010) Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM). In: 3rd International Symposium on Transparent Conductive Materials, TCM 2010, 17-21 Oct 2010, Crete, Greece.

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Item Type: Conference or Workshop Item (Poster)
Divisions: Faculty of Technology
Faculty of Technology > School of Engineering
Depositing User: Panagiotis Karagiannidis
Date Deposited: 02 Oct 2017 13:19
Last Modified: 18 Dec 2019 15:41
URI: http://sure.sunderland.ac.uk/id/eprint/7899
ORCID for Panagiotis Karagiannidis: ORCID iD orcid.org/0000-0002-2709-4161

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