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Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM)

Karagiannidis, Panagiotis, Hastas, N. A., Koutsogeorgis, D. C., Tsakonas, C., Logothetidis, S., Cranton, W. M. and Dimitriadis, C. A. (2010) Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM). In: 3rd International Symposium on Transparent Conductive Materials, TCM 2010, 17-21 Oct 2010, Crete, Greece.

Item Type: Conference or Workshop Item (Poster)
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More Information

Depositing User: Panagiotis Karagiannidis

Identifiers

Item ID: 7899
URI: http://sure.sunderland.ac.uk/id/eprint/7899

Users with ORCIDS

ORCID for Panagiotis Karagiannidis: ORCID iD orcid.org/0000-0002-2709-4161

Catalogue record

Date Deposited: 02 Oct 2017 13:19
Last Modified: 18 Dec 2019 15:41

Contributors

Author: Panagiotis Karagiannidis ORCID iD
Author: N. A. Hastas
Author: D. C. Koutsogeorgis
Author: C. Tsakonas
Author: S. Logothetidis
Author: W. M. Cranton
Author: C. A. Dimitriadis

University Divisions

Faculty of Technology
Faculty of Technology > School of Engineering

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