Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM)
Karagiannidis, Panagiotis, Hastas, N. A., Koutsogeorgis, D. C., Tsakonas, C., Logothetidis, S., Cranton, W. M. and Dimitriadis, C. A. (2010) Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM). In: 3rd International Symposium on Transparent Conductive Materials, TCM 2010, 17-21 Oct 2010, Crete, Greece.
| Item Type: | Conference or Workshop Item (Poster) |
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| Depositing User: Panagiotis Karagiannidis |
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| Item ID: 7899 |
| URI: http://sure.sunderland.ac.uk/id/eprint/7899 |
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Catalogue record
| Date Deposited: 02 Oct 2017 13:19 |
| Last Modified: 04 Jun 2025 15:28 |
| Author: |
Panagiotis Karagiannidis
|
| Author: | N. A. Hastas |
| Author: | D. C. Koutsogeorgis |
| Author: | C. Tsakonas |
| Author: | S. Logothetidis |
| Author: | W. M. Cranton |
| Author: | C. A. Dimitriadis |
University Divisions
Faculty of Business and Technology > School of Computer Science and EngineeringFaculty of Business and Technology
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