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Karagiannidis, Panagiotis, Hastas, N. A., Koutsogeorgis, D. C., Tsakonas, C., Logothetidis, S., Cranton, W. M. and Dimitriadis, C. A. (2010) Nanoscale Electrical Characterization of Indium Tin Oxide Thin Films by Scanning Spreading Resistance Microscopy (SSRM). In: 3rd International Symposium on Transparent Conductive Materials, TCM 2010, 17-21 Oct 2010, Crete, Greece.